The FlexSEM from Hitachi is a benchtop or floor-standing electron microscope specially developed to integrate the flexibility and performance of a full-size SEM with the ease of a benchtop SEM.
Hitachi FlexSEM 1000 Variable-Pressure Scanning Electron Microscope
Video Credit: Hitachi High-Technologies Europe
Full-SEM imaging performance
- Resolution comparable to a full-size SEM
- Complete control over vacuum level, beam current, and acceleration voltage
- Users can observe composition (BSE), morphology (SE), or both on insulating or conductive samples
High-performance elemental analysis
- Quick and precise elemental analysis with the help of built-in EDS from leading suppliers
- EDS up to 20 kV can be operated to provide access to more peaks
- Exhibit true elemental distribution with the help of live peak deconvolution
Safe and easy specimen handling
- Users can make use of the navigation camera to find the area of interest
- Analyze broad areas with image stitching
- Users can easily overlay and correlate their SEM and optical images
- Users can manage huge specimens with the help of the five axes stage
Go further
- Hydrated specimens can be imaged with a cold stage or Hitachi’s patented ionic liquid
- Automated particle analysis for fibers, inclusions, asbestos, technical cleanliness, etc.
- 3D surface metrology can be analyzed with the help of angle, depth, or roughness measurements
- STEM can be added for transmitted electron imaging or CL can be added for pharmaceutical or geological samples
(1) Bacteria, 7 kV, magnification 20,000x; (2) Pharmaceutics, magnification 7,500x; (3) Paper, low-vacuum, 2,700x. Image Credit: Hitachi High-Technologies Europe